STM7-BSW

STM7-BSW measurement support software for measuring microscopes helps make your inspections more efficient. You can capture and display images, make observations and measurements, and create reports all from the same screen.

Quickly and Accurately Measure Objects with Complex Shapes

It is essential to see your measuring microscope’s output display clearly and easily. This software was created to do just that, helping deliver complex measurements with greater accuracy. The software also enables you to take advantage of digital microscope cameras.

Capture Clear, Sharp Images with Our Digital Microscope Cameras

High performance with fast live display

DP28

Image resolution
4104 × 2174
Frame rate
15 fps (max.)
PC interface
USB 3.1 Gen1

DP23

Image resolution
3088 × 2076
Frame rate
25 fps (max.)
PC interface
USB 3.1 Gen1

Excellent value with a high price/performance ratio

STM7-CU

STM7-CU

Image resolution
2048 × 1536
Frame rate
11.2 fps (max.)
PC interface
USB 2.0

Place the Sample and Start to Measure—No Parallel Alignment Required

Direct Measurement


Measurements are made by receiving coordinates input via the STM7 microscope.

Recall Measurement

Once measured and calculated, coordinates can be reused for subsequent measurements. This eliminates the need to do the same work twice, enabling a more efficient workflow.

Virtual Point Measurement

Intersections, central points, lengths,and a range of other measurements can be made by drawing straight lines and circles, which can then be set to remain as reference points on acquired sample images.

Alignment Measurement

Both the origin and the X-axis are set with respect to the sample, allowing the sample to be measured even when it’s not aligned with the stage.

XZ Plane Measurement

Conventional measuring microscopes measure the XY plane directly from above. However in response to user demands, we incorporated an XZ plane measurement function in the STM7-BSW to enable the measurement of crosssections as seen from the side. Now measurements that used to be difficult are much easier—such as radius measurements for vertical sections of hemispherical objects or measurement of the depths of grooves with curved bases compared to a reference line.